• DocumentCode
    1831950
  • Title

    An effective design technique to reduce leakage power

  • Author

    Raj, Nikhil ; Lorenzo, Rohit

  • Author_Institution
    Dept. of Electron. & Commun. Eng., NIT Kurukshetra, Kurukshetra, India
  • fYear
    2012
  • fDate
    1-2 March 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Now a day´s low power Design is a essential requirement for This electronic document is a “live” template. The various components of your paper [title, text, heads, etc.] are already defined on the style hardware implementation. Technology moving into deep submicron region causes increase in leakage power. MTCMOS is promising technique for reducing leakage power but use of this technique results in delay overhead in active mode and data retention problem for sequential circuit. This paper propose a design technique for reducing the leakage power and data loss problem during sleep mode. Simulation results show that reduction in leakage power while preserving the state of the circuit.
  • Keywords
    electrical faults; sequential circuits; delay overhead; effective design technique; electronic document; leakage power; retention problem; sequential circuit; submicron region; CMOS integrated circuits; Digital circuits; Leakage current; Logic gates; Switching circuits; Threshold voltage; Transistors; leakage power and Multithreshold CMOS (MTCMOS) voltage; low power; power gating;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical, Electronics and Computer Science (SCEECS), 2012 IEEE Students' Conference on
  • Conference_Location
    Bhopal
  • Print_ISBN
    978-1-4673-1516-6
  • Type

    conf

  • DOI
    10.1109/SCEECS.2012.6184722
  • Filename
    6184722