• DocumentCode
    1832685
  • Title

    Why increasing immunity test levels is not sufficient for high-reliability and critical equipment

  • Author

    Armstrong, Keith

  • Author_Institution
    Cherry Clough Consultants, UK
  • fYear
    2009
  • fDate
    17-21 Aug. 2009
  • Firstpage
    30
  • Lastpage
    35
  • Abstract
    It is often assumed that passing an EM immunity test at 100% of the level of the worst-case disturbance that can occur over the lifecycle, and taking measurement uncertainties into account, will prove that the design of the tested equipment will almost never suffer from errors or malfunctions due to that disturbance in real life. Unfortunately, although the above is necessary when testing the EM immunity of equipment that must function with high reliability - such testing is insufficient to demonstrate that high-reliability, security, mission-critical or safety-critical equipment or systems will achieve tolerable failure levels over their life-cycles despite the EM disturbances in their environments. Part II of this paper explains why this is so, and Part III briefly introduces the techniques that are necessary for achieving sufficient confidence in EMC, when high reliability is required.
  • Keywords
    immunity testing; reliability; EM disturbance; EM immunity test; failure level; high-reliability equipment; immunity test level; measurement uncertainties; mission-critical equipment; safety-critical equipment; worst-case disturbance; Costs; Electromagnetic compatibility; Electromagnetic interference; Electronic circuits; Electronic equipment; Immune system; Immunity testing; Life testing; Mission critical systems; Security; EMC; EMI; functional safety; high-reliability; mission-critical; reliability; safety risks; safety-critical; security;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2009. EMC 2009. IEEE International Symposium on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-4266-9
  • Electronic_ISBN
    978-1-4244-4058-0
  • Type

    conf

  • DOI
    10.1109/ISEMC.2009.5284587
  • Filename
    5284587