• DocumentCode
    1832991
  • Title

    Transistor Test-Fixture with Biasing for Millimeter-Wave Noise Measurement

  • Author

    Izadian, Jamal S.

  • Author_Institution
    AVANTEK, INC., MILPITAS, CA. 95035, (408)946-4233
  • Volume
    11
  • fYear
    1987
  • fDate
    31929
  • Firstpage
    28
  • Lastpage
    37
  • Abstract
    Development of two waveguide transistor test-fixtures for Ka and U-band is presented. The biasing network has been designed as an integral part of the test-fixture eliminating the need for external biasing networks. The transistors under test are mounted on quartz or alumina substrate of .100 × .100 × .010 inch with source ground connections provided by two plated-through-via-holes. Some suggestions for the improvement of the test-fixtures and measurement repeatability are given.
  • Keywords
    Fixtures; Flanges; Impedance; Microstrip; Millimeter wave measurements; Millimeter wave transistors; Noise measurement; System testing; Tuners; Waveguide transitions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Spring, 29th
  • Conference_Location
    Las Vegas, NV, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1987.323851
  • Filename
    4119411
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1832991