DocumentCode :
1833021
Title :
An Automated System for De-Embedded Measurements of Noise and Gain Parameters
Author :
Hirsch, V.A. ; Brunsman, M.D. ; Miers, T.H.
Author_Institution :
Ball Aerospace Systems Division, Boulder, Colorado
Volume :
11
fYear :
1987
fDate :
31929
Firstpage :
38
Lastpage :
51
Abstract :
This paper describes an automated noise and gain parameter measurement system which operates to 26.5 GHz and incorporates test fixture de-embedding. A unique combination of hardware components, operating software and fundamentally proven measurement techniques have been integrated to form a test system capable of highly accurate and repeatable noise and gain measurements. De-embedded noise and gain parameters obtained using this system will be presented for an 0.3 micron gate GaAs FET.
Keywords :
Automatic testing; FETs; Fixtures; Gain measurement; Gallium arsenide; Hardware; Measurement techniques; Noise measurement; Software testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference Digest-Spring, 29th
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
0-7803-5686-1
Type :
conf
DOI :
10.1109/ARFTG.1987.323854
Filename :
4119412
Link To Document :
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