Title :
Characterizing Resonators with S-Parameter Network Analyzers
Author_Institution :
Innovative Measurement Solutions
Keywords :
Admittance; Capacitance; Equivalent circuits; Frequency measurement; Impedance; Pins; RLC circuits; Resonance; Resonant frequency; Scattering parameters;
Conference_Titel :
ARFTG Conference Digest-Spring, 29th
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1987.323873
