• DocumentCode
    1833686
  • Title

    Measurement of the Excess Noise of a One-Port Device

  • Author

    Griffiths, James R. ; Cerney, John L.

  • Author_Institution
    Texas Instruments Incorporated, P.O. Box 655474 MS 255, Dallas, TX 75265
  • Volume
    12
  • fYear
    1987
  • fDate
    Dec. 1987
  • Firstpage
    97
  • Lastpage
    101
  • Abstract
    In the past, excess noise measurements have been difficult to make and repeat. This has been due to test equipment performance limitations and uncertainties associated with these types of measurements. In this paper a new measurement technique is introduced that provides greater accuracy and improved repeatability.
  • Keywords
    Dynamic range; Gain measurement; Impedance measurement; Low-noise amplifiers; Noise figure; Noise measurement; Power combiners; Power measurement; Test equipment; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Winter, 30th
  • Conference_Location
    Dallas, TX, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1987.323886
  • Filename
    4119446
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1833686