Title :
Delay and slew metrics using the lognormal distribution
Author :
Alpert, C.J. ; Liu, F. ; Kashyap, C. ; Devgan, A.
Author_Institution :
IBM Corp., Austin, TX, USA
Abstract :
For optimizations like physical synthesis and static timing analysis, efficient interconnect delay and slew computation is critical. Since one cannot often afford to run AWE, constant time solutions are required. This work presents the first complete solution to closed form formulae for both delay and slew. Our metrics are derived from matching circuit moments to the lognormal distribution. From a single table, one can easily implement the metrics for delay and slew for both step and ramp inputs. Experiments validate the effectiveness of the metrics for nets from a real industrial design.
Keywords :
delay estimation; integrated circuit interconnections; log normal distribution; interconnect delay; lognormal distribution; physical synthesis; slew metrics; static timing analysis; Algorithm design and analysis; Circuit simulation; Circuit synthesis; Computational modeling; Delay estimation; Integrated circuit interconnections; Linear circuits; Permission; Physics computing; Timing;
Conference_Titel :
Design Automation Conference, 2003. Proceedings
Conference_Location :
Anaheim, CA
Print_ISBN :
1-58113-688-9
DOI :
10.1109/DAC.2003.1219029