DocumentCode
1833719
Title
Intelligent backtracking in test generation for combinational circuits
Author
Zeng, W.B. ; Wei, D.Z.
Author_Institution
CAD Open Lab., Acad. Sinica, Beijing, China
fYear
1989
fDate
2-4 Oct 1989
Firstpage
48
Lastpage
51
Abstract
An intelligent backtracking algorithm for the test generation of combinational circuits is introduced. This algorithm, called INBACK, differs from PODEM and FAN in that, when a contradiction occurs, it chooses a backtracking element which is most likely to eliminate the contradiction and change its value. An efficient method of identifying such backtracking elements is established. Experiments on 5 of 10 benchmark circuits with this method show that the average backtracking times are reduced
Keywords
automatic testing; combinatorial circuits; logic testing; INBACK; backtracking times; benchmark circuits; combinational circuits; contradiction; intelligent backtracking algorithm; test generation; Automatic testing; Benchmark testing; Circuit faults; Circuit testing; Combinational circuits; Computers; Laboratories; Resumes;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Design: VLSI in Computers and Processors, 1989. ICCD '89. Proceedings., 1989 IEEE International Conference on
Conference_Location
Cambridge, MA
Print_ISBN
0-8186-1971-6
Type
conf
DOI
10.1109/ICCD.1989.63326
Filename
63326
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