• DocumentCode
    1834548
  • Title

    Electrostatic Discharge analysis of Multi Layer Ceramic capacitors

  • Author

    Rostamzadeh, Cyrous ; Dadgostar, Hamidreza ; Canavero, Flavio

  • Author_Institution
    Robert Bosch LLC, Plymouth, MI, USA
  • fYear
    2009
  • fDate
    17-21 Aug. 2009
  • Firstpage
    35
  • Lastpage
    40
  • Abstract
    A rigorous analysis of Electrostatic Discharge susceptibility of Multi Layer Ceramic (MLC) capacitors is carried out. The impact of ESD stress applied at the connector pins of an electronic control module, protected by utilizing 0603 package MLC capacitors is evaluated. Effectiveness of MLC capacitors for protection of integrated circuits cannot be underestimated, nor should it be assumed as an effective ESD robust solution. Meanwhile, any degradation, or physical damage to MLC capacitors should not be ignored. This analysis concentrates on the permanent physical degradation to the ESD capacitors employed for the protection of active components for an automotive control module. However, this does not limit its scope to specialized automotive applications. In general, the same principles are applicable to all electronic products employing MLC capacitors as per ESD protection and filter mechanism.
  • Keywords
    automotive electronics; ceramic capacitors; electrostatic discharge; integrated circuit reliability; 0603 package MLC capacitors; ESD protection; ESD stress; automotive control module; electronic control module; electrostatic discharge analysis; electrostatic discharge susceptibility; filter mechanism; multi layer ceramic capacitors; physical degradation; Capacitors; Ceramics; Connectors; Degradation; Electronics packaging; Electrostatic analysis; Electrostatic discharge; Pins; Protection; Stress control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2009. EMC 2009. IEEE International Symposium on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-4266-9
  • Electronic_ISBN
    978-1-4244-4058-0
  • Type

    conf

  • DOI
    10.1109/ISEMC.2009.5284661
  • Filename
    5284661