Bias Oscillations in MMIC Measurements

This paper??s aim is twofold: 1. to analyze tlie nature of bias oscillations, 2. to present the tools for stability analysis and the solution to bias oscillations problem. I see two recent trends: that of automating measurements, and that of taking them over wide bias range for sake of nonlinear modelling ) make the problem of bias oscillations even more important than in the past. This paper expands analysis of Kerwin and Petruno onto MMIC MESFETs tested over wide bias range. it extensively uses new CAD methods and applies new FET model which was obtained directly from measurements.