• DocumentCode
    1837537
  • Title

    Accuracy Improvements to On-Wafer Amplifier Noise Figure Measurements

  • Author

    Woodin, C.E. ; Wandrei, D.L. ; Adamian, V.

  • Author_Institution
    ATN Microwave inc. Billerica, Massachusetts
  • Volume
    20
  • fYear
    1991
  • fDate
    Dec. 1991
  • Firstpage
    129
  • Lastpage
    138
  • Abstract
    It has been demonstrated that typical scalar and vector measurement systems are not sufficient to characterize the 50 ohm noise figure of low noise amplifiers, where the tolerance for ripple in the measurement is much stricter due the application. Two methods have been presented which rectify the problem and provide similar or reduced measurement time to existing methods.
  • Keywords
    Calibration; Gain measurement; Impedance; Loss measurement; Low-noise amplifiers; MMICs; Noise figure; Noise measurement; Probes; Software measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Winter, 38th
  • Conference_Location
    San Diego, CA, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1991.324046
  • Filename
    4119622
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1837537