DocumentCode :
1837737
Title :
Optical and structural study of Ag/ZrO2/SiO2 planar waveguide structure: Glass/film/air
Author :
Kandasamy, Senthil Kumar ; Palanisamy, Manivasakan
Author_Institution :
Centre for Nano Sci. & Technol., K.S. Rangasamy Coll. of Technol., Tiruchengode, India
fYear :
2012
fDate :
1-2 March 2012
Firstpage :
1
Lastpage :
4
Abstract :
The objective of this work is to prepare silver zirconia nanocomposite and to measure the refractive index of the film coated on glass substrate. And also, to check whether is the composite suitable for optical waveguide. There is an increasing commercial demand for nanoparticles due to their wide applicability in various areas such as optics, electronics, catalysis, chemistry, energy and medicine. Noble metal particles such as silver and gold are of great significance due to their size-dependent optical properties. Development of new nanomaterials with metal nanoparticles (Ag, Au, etc.) deposited on oxide surfaces, embedded within pores or encapsulated in its matrices have gained much attention. The prepared solution was deposited on high purity and polished glass substrate using spin coating in the fabrication process. The precise thickness control was achieved by using the layer-by-layer deposition technique. The films are deposited on microscopic glass slides with thicknesses ranging between 1000 and 4000 nm were prepared by a multi-layer process. Films which are characterized by UV Spectroscopy and AFM. Chemical composition of the particles was investigated by X-ray photoelectron spectroscopy (XPS). Fourier transform infrared spectroscopy (FTIR) was also performed to find the groups of the capping materials which were responsible for the stability of the nanoparticles.
Keywords :
Fourier transform spectra; X-ray photoelectron spectra; atomic force microscopy; chemical analysis; infrared spectra; nanocomposites; nanofabrication; nanoparticles; nanophotonics; optical fabrication; optical films; optical planar waveguides; refractive index measurement; silver; spin coating; thickness control; thin films; ultraviolet spectra; zirconium compounds; AFM; Ag-ZrO2-SiO2; FTIR spectroscopy; Fourier transform infrared spectroscopy; SiO2; UV spectroscopy; X-ray photoelectron spectroscopy; XPS; capping materials; chemical composition; fabrication process; film coating; high purity polished glass substrate; layer-by-layer deposition technique; microscopic glass slides; multilayer process; nanomaterials; noble metal nanoparticles; optical planar waveguide structure; oxide surfaces; refractive index measurement; silver zirconia nanocomposite; size 1000 nm to 4000 nm; size-dependent optical properties; spin coating; structural properties; thickness control; Glass; Optical films; Optical refraction; Optical variables control; Optical waveguides; Silver; AFM; CTAB; Waveguide; Zirconium Oxalate;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical, Electronics and Computer Science (SCEECS), 2012 IEEE Students' Conference on
Conference_Location :
Bhopal
Print_ISBN :
978-1-4673-1516-6
Type :
conf
DOI :
10.1109/SCEECS.2012.6184992
Filename :
6184992
Link To Document :
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