Title :
A 2.6 V GSM/PCN dual band variable gain low noise RF down conversion mixer
Author :
Bonkee Kim ; Kyung-Suc Nah ; Tae-Won Ahn ; Han-Il Lee ; Je-Kwang Cho ; Byeong-Ha Park
Author_Institution :
RF projects, Samsung Electron. Co. Ltd., Kyunggi, South Korea
Abstract :
As a building block for a GSM/PCN dual band RF transceiver IC, a low noise variable gain RF down conversion mixer is designed and fabricated using a 15 GHz-f/sub T/, 0.5 /spl mu/m 3-metal 2-poly BiCMOS process. Careful consideration is paid to the low noise performance of the mixer. Moreover, using constant-impedance input/output stages, RF input and IF output return losses are maintained under -16 dB for both high and low gain modes. Measured gain and DSB noise figure of the mixer are 10.9 dB and 9.1 dB, respectively, for GSM band, and 9.6 dB and 8.1 dB, respectively, for PCN band. Gain difference between high and low gain modes is 11 dB and 11.8 dB for GSM and PCN, respectively. Total DC currents are 13 mA for GSM and 11.5 mA for PCN from a 3 V supply voltage. Mixer performance is maintained with supply voltage down to 2.6 V.
Keywords :
BiCMOS analogue integrated circuits; UHF frequency convertors; UHF integrated circuits; UHF mixers; cellular radio; integrated circuit design; integrated circuit noise; personal communication networks; transceivers; 0.5 micron; 10.9 dB; 13 mA; 15 GHz; 1840 MHz; 2.6 V; 3 V; 3-metal 2-poly BiCMOS process; 8.1 dB; 9.1 dB; 9.6 dB; 940 MHz; DSB noise figure; GSM/PCN dual band RF transceiver IC; GSM/PCN dual band variable gain low noise RF down conversion mixer; IF output return losses; RF input return losses; constant-impedance input/output stages; high gain mode; low gain mode; low noise variable gain RF down conversion mixer; supply voltage; total DC currents; BiCMOS integrated circuits; Dual band; GSM; Gain; Integrated circuit noise; Personal communication networks; Radio frequency; Radiofrequency integrated circuits; Transceivers; Voltage;
Conference_Titel :
Radio Frequency Integrated Circuits (RFIC) Symposium, 2002 IEEE
Conference_Location :
Seattle, WA, USA
Print_ISBN :
0-7803-7246-8
DOI :
10.1109/RFIC.2002.1011941