Title :
Candidate spacecraft electronics subjected to ELDRS per Mil-Std-883/method 1019.6 dose rate condition D, /spl les/10 mrad/sec
Author :
Meshel, David ; Love, David P. ; Peterson, Chris ; Mil, Kathleen
Author_Institution :
Northrop Grumman Electron. Syst., Baltimore, MD, USA
Abstract :
Eight linear bipolar microcircuits were subjected to Mil-Std-883 test method 1019.6 condition D. Both biased and unbiased exposures were made. Unbiased exposures in some cases are shown to have even a greater low dose rate sensitivity.
Keywords :
bipolar analogue integrated circuits; integrated circuit testing; military standards; radiation effects; space vehicle electronics; ELDRS; Mil-Std-883 test method 1019.6; biased exposures; dose rate condition D; enhanced low dose rate sensitivity; linear bipolar microcircuits; spacecraft electronics; unbiased exposures; Aerospace electronics; Data acquisition; Instruments; Low voltage; Manufacturing; Military standards; Space technology; Space vehicles; Temperature sensors; Testing;
Conference_Titel :
Radiation Effects Data Workshop, 2004 IEEE
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-8697-3
DOI :
10.1109/REDW.2004.1352899
