DocumentCode :
1838282
Title :
Noise model, analysis and characterization of a differential active pixel sensor
Author :
Sander, David ; Nelson, Nicole ; Abshire, Pamela
Author_Institution :
Sch. of Electr. & Comput. Eng., Univ. of Maryland, College Park, MD
fYear :
2008
fDate :
18-21 May 2008
Firstpage :
1780
Lastpage :
1783
Abstract :
We report the design, analytical model and experimental noise performance from a photo sensor fabricated in a 0.5 mum commercial CMOS process. The sensor is a novel differential active pixel sensor which performs in-pixel correlated double sampling (CDS) to reduce correlated and environmental noise at the expense of increased thermally generated noise sources such as reset and readout noise. In comparison with a representative single ended sensor, the differential sensor exhibits an increased fundamental reset and readout noise of 117% and 58% respectively.
Keywords :
CMOS image sensors; noise; CMOS process; correlated double sampling; differential active pixel sensor; noise analysis; noise characterization; noise model; photo sensor; representative single ended sensor; thermally generated noise sources; Active noise reduction; Fluorescence; Low-frequency noise; MOS devices; Noise generators; Photodiodes; Power supplies; Sensor phenomena and characterization; Thermal sensors; Working environment noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-1683-7
Electronic_ISBN :
978-1-4244-1684-4
Type :
conf
DOI :
10.1109/ISCAS.2008.4541784
Filename :
4541784
Link To Document :
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