Title :
IEE Colloquium on `Electromagnetic Hazards to Active Electronic Components´ (Digest No.1994/008)
Abstract :
The following topics were dealt with: SPICE simulation; ESD; susceptibility measurements; electromagnetic guns; IC testing; and logic circuit effects
Keywords :
electromagnetic compatibility; electromagnetic interference; electronic equipment testing; electrostatic discharge; ESD; IC testing; SPICE simulation; electromagnetic guns; logic circuit effects; susceptibility measurements;
Conference_Titel :
Electromagnetic Hazards to Active Electronic Components, IEE Colloquium on
Conference_Location :
London
