DocumentCode :
1838950
Title :
A repairable and diagnosable cellular array on multiple-valued logic
Author :
Kamiura, Naotake ; Hata, Yutaka ; Yamato, Kazuharu
Author_Institution :
Fac. of Eng., Himeji Inst. of Technol., Japan
fYear :
1993
fDate :
24-27 May 1993
Firstpage :
92
Lastpage :
97
Abstract :
A diagnosable and repairable k-valued cellular array is proposed, assuming a single fault, i.e., either a stuck-at-0 fault or a stuck-at-(k-1) fault of switches, occurs in the array. By building in a duplicate column iteratively, a fault-tolerant array can be constructed for the stuck-at-(k-1) fault, therefore, since the stuck-at-(k-1) fault need not be diagnosed, the diagnosis is simple and easy. Furthermore, the array can be repaired easily by a systematic procedure. A comparison with other rectangular arrays shows that the present array has advantages with respect to the number of cells and steps for generating all test inputs
Keywords :
cellular arrays; fault tolerant computing; logic testing; many-valued logics; diagnosable cellular array; fault-tolerant array; k-valued cellular array; multiple-valued logic; repairable cellular array; stuck-at-0 fault; Buildings; Circuit faults; Circuit testing; Fault tolerance; Large scale integration; Logic arrays; Logic circuits; Logic functions; Logic testing; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multiple-Valued Logic, 1993., Proceedings of The Twenty-Third International Symposium on
Conference_Location :
Sacramento, CA
Print_ISBN :
0-8186-3350-6
Type :
conf
DOI :
10.1109/ISMVL.1993.289575
Filename :
289575
Link To Document :
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