• DocumentCode
    1839352
  • Title

    Techniques for Automated On-Wafer Measurements of Sub-30PS Transition-Time Pulse and Data Amplifiers

  • Author

    Fisher, Robert A. ; Kerwin, Kevin J.

  • Author_Institution
    Hewlett-Packard Company, Microwave Technology Division, M/S 1US-E, 1412 Fountaingrove Parkway, Santa Rosa, CA 95403-1788 (707) 577-3674
  • Volume
    24
  • fYear
    1993
  • fDate
    Dec. 1993
  • Firstpage
    48
  • Lastpage
    54
  • Abstract
    Techniques for calibrating and measuring the relative time of arrivals of pulse edges for wafer-probed pulse amplifier ICs are described. Fixturing, waveform dependency, and dc measurement are considered. Criteria for selecting an appropriate level of calibration are described. These techniques are successfully applied in the measurement of sub-30 ps edge transitions from a pulse amplifier IC.
  • Keywords
    Fixtures; Instruments; Integrated circuit measurements; Microwave technology; Pulse amplifiers; Pulse generation; Pulse measurements; Pulsed power supplies; Transmission line measurements; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Fall, 42nd
  • Conference_Location
    San Jose, CA, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1993.327041
  • Filename
    4119712
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1839352