DocumentCode :
1839525
Title :
ESD protection design for 900-MHz RF receiver with 8-kV HBM ESD robustness
Author :
Ming-Dou Ker ; Wen-Yu Lo ; Chien-Ming Lee ; Chia-Pei Chen ; Hong-Sing Kao
Author_Institution :
Inst. of Electron., Nat. Chiao Tung Univ., Hsinchu, Taiwan
fYear :
2002
fDate :
3-4 June 2002
Firstpage :
427
Lastpage :
430
Abstract :
This paper presents a state-of-art ESD protection design for an RF circuit with a human-body-model (HBM) ESD robustness of 8 kV. By including a turn-on efficient power-rails clamp circuit into the RF circuit, the ESD clamp devices of the RF input pin are operated in the forward-biased conduction, rather than the traditional junction breakdown condition. Therefore, the dimension of ESD devices for the RF input pin can be further downsized to reduce the input capacitance loading for the RF signal. This design has been successfully applied in a 900 MHz RF receiver and fabricated in 0.25 /spl mu/m CMOS process with a thick top metal layer. The experimental results have confirmed that its ESD robustness is as high as >8 kV under the HBM ESD test.
Keywords :
CMOS integrated circuits; UHF integrated circuits; electrostatic discharge; protection; radio receivers; 0.25 micron; 8 kV; 900 MHz; CMOS process; ESD clamp devices; ESD protection design; HBM ESD robustness; HBM ESD test; RF circuit; RF input pin; RF receiver; RFIC; forward-biased conduction; human-body model; input capacitance loading reduction; thick top metal layer; turn-on efficient power-rails clamp circuit; CMOS process; Capacitance; Circuits; Clamps; Electric breakdown; Electrostatic discharge; Protection; Radio frequency; Robustness; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio Frequency Integrated Circuits (RFIC) Symposium, 2002 IEEE
Conference_Location :
Seattle, WA, USA
ISSN :
1529-2517
Print_ISBN :
0-7803-7246-8
Type :
conf
DOI :
10.1109/RFIC.2002.1012083
Filename :
1012083
Link To Document :
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