DocumentCode :
1839635
Title :
Microwave dielectric relaxation study of 1-Hexanol with 1-propenol mixture by using time domain reflectometry at 300K
Author :
Tidar, Anil ; Shafiyoddin, Sayyad ; Kamble, Siddharth ; Dharne, G.M. ; Patil, S.S. ; Khirade, P.W. ; Mehrotra, S.C.
Author_Institution :
Dept. of Phys., Dr. Babasaheb Ambedkar Marathwada Univ., Aurangabd, India
fYear :
2009
fDate :
14-16 Dec. 2009
Firstpage :
1
Lastpage :
4
Abstract :
Dielectric relaxation measurement of 1-Hexanol (1-HE), 1-Propenol (1-PR) & their complex have been carried out over the entire concentration range using time domain reflectometry technique at 300 K in the frequency range of 10 KHz to 20-GHz. Bilinear calibration method is used to obtain complex permittivity ??*(??) from complex reflection coefficient ??*(??) over the frequency range of 10 MHz to 20 GHz. The Excess inverse relaxation time (1/t)E, Kirkwood correlation factor (geff) and Bruggeman factor (fB) are also estimated to study the solute-solvent interaction. The value of dielectric constant increases & relaxation time decreases with increase in concentration 1-PR in 1-HE. Bruggeman plot shows a non - linearity of the curve for all concentration, indicate the hetero interaction which may be due to hydrogen bonding of the OH group of 1-PR with 1-HE.
Keywords :
dielectric relaxation; permittivity; reflectometers; time-domain reflectometry; 1-hexanol; 1-propenol mixture; Bruggeman factor; Bruggeman plot; bilinear calibration method; complex permittivity; complex reflection coefficient; correlation factor; dielectric constant; dielectric relaxation measurement; excess inverse relaxation time; frequency 10 kHz to 20 GHz; hydrogen bonding; microwave dielectric relaxation study; solute-solvent interaction; temperature 300 K; time domain reflectometry; 1-Hexanol; 1-Propanol; Bruggeman factor etc.; Excess permittivity; TDR;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Electromagnetics Conference (AEMC), 2009
Conference_Location :
Kolkata
Print_ISBN :
978-1-4244-4818-0
Electronic_ISBN :
978-1-4244-4819-7
Type :
conf
DOI :
10.1109/AEMC.2009.5430597
Filename :
5430597
Link To Document :
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