Title :
Noise Parameter Data Comparison While Varying the On-Wafer S-Parameter Calibration Technique
Author_Institution :
Measurement Engineering Department, Equipment Management Center, TRW, Space and Electronics Group, One Space Park, Redondo Beach, CA 90266
Abstract :
The results of an on-wafer device noise parameter measurement data comparison while varying the technique of the respective on-wafer scattering (S) parameter calibration portion of the overall noise parameter measurement system calibration are presented. Through this comparison, the sensitivity of the measured noise parameters to the on-wafer S-parameter calibration is shown.
Keywords :
Calibration; Coplanar waveguides; Geometry; NIST; Noise figure; Noise measurement; Probes; Scattering parameters; Software algorithms; System testing;
Conference_Titel :
ARFTG Conference Digest-Fall, 44th
Conference_Location :
Boulder, CO, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1994.327085
