Millimeter-wave network analyzers based on photonic techniques

Author

Nagatsuma, T. ; Sahri, N. ; Hirata, A. ; Royter, Y. ; Sasaki, A.

Author_Institution

NTT Telecommun. Energy Labs., NTT Corp., Kanagawa, Japan

Volume

3

fYear

2002

fDate

2-7 June 2002

Firstpage

1497

Abstract

We report on active photonic probes which enable on-wafer measurements of electrical scattering parameters with a bandwidth exceeding 300 GHz. The probes employ a high-speed uni-traveling-carrier photodiode to optically generate the electrical stimulus and the electro-optic sampling technique to measure the electrical response signals. The probe modules are packaged using micro-optic technology and exhibit excellent optical characteristics. They are easy to use and enable reliable and reproducible measurements and should help to overcome the bandwidth-limitation of present all-electronic systems.

Keywords

MIMIC; S-parameters; integrated circuit testing; micro-optics; microwave photonics; millimetre wave measurement; network analysers; packaging; photodiodes; probes; test equipment; 300 GHz; EHF; MM-wave network analyzers; active photonic probes; electrical response signals; electrical scattering parameters; electro-optic sampling technique; high-speed photodiode; integrated photonic probe; micro-optic packaging; micro-optics technology; multi-port S-parameter measurement; network analyzers; on-wafer measurements; optically-generated electrical stimulus; photonic techniques; probe modules; uni-traveling-carrier photodiode; Bandwidth; Electric variables measurement; High speed optical techniques; Millimeter wave measurements; Millimeter wave technology; Optical scattering; Photodiodes; Probes; Scattering parameters; Signal generators;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 2002 IEEE MTT-S International

Conference_Location

Seattle, WA, USA

ISSN

0149-645X

Print_ISBN

0-7803-7239-5

Type

conf

DOI

10.1109/MWSYM.2002.1012139

Filename

1012139