DocumentCode
1840980
Title
Foreword
Author
Chein-Wei Jen
fYear
2005
fDate
27-29 April 2005
Abstract
Presents the welcome message from the conference proceedings.
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, Automation and Test, 2005. (VLSI-TSA-DAT). 2005 IEEE VLSI-TSA International Symposium on
Conference_Location
Hsinchu, Taiwan
Print_ISBN
0-7803-9060-1
Type
conf
DOI
10.1109/VDAT.2005.1500002
Filename
1500002
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