• DocumentCode
    1841508
  • Title

    Race-condition-aware retiming

  • Author

    Huang, Shih-Hsu ; Lu, Feng-Pin ; Yu, Wei-Chieh ; Nieh, Ynw-Tyng

  • Author_Institution
    Dept. of Electron. Eng., Chung Yuan Christian Univ., Chung Li, Taiwan
  • fYear
    2005
  • fDate
    27-29 April 2005
  • Firstpage
    59
  • Lastpage
    62
  • Abstract
    Retiming transformation relocates registers in a circuit to shorten the clock cycle time. However, with the advent of deep sub-micron era, the hold constraints often limit the smallest feasible clock period that the retiming transformation can achieve. Therefore, a combination of retiming transformation and delay insertion may lead to further clock period reduction. In this paper, we propose a retiming methodology, called race-condition-aware, retiming (RCA retiming), to determine, a retiming solution by relaxing the critical hold constraints that actually limit the circuit performance. Our objective is not only to optimize the clock period, but also attempts to minimize the required inserted delay. Experimental data show that our approach can make significant improvement in the circuit performance with small overhead in the circuit area.
  • Keywords
    circuit analysis computing; clocks; timing circuits; clock cycle time; clock period reduction; critical hold constraints; delay insertion; race-condition-aware retiming; retiming transformation; Circuit optimization; Clocks; Delay; Integrated circuit interconnections; Logic circuits; Logic gates; Registers; Table lookup; Timing; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, Automation and Test, 2005. (VLSI-TSA-DAT). 2005 IEEE VLSI-TSA International Symposium on
  • Print_ISBN
    0-7803-9060-1
  • Type

    conf

  • DOI
    10.1109/VDAT.2005.1500020
  • Filename
    1500020