• DocumentCode
    1843662
  • Title

    Design and analysis of skewed-distribution scan chain partition for improved test data compression

  • Author

    Wang, Sying Jyan ; Chen, Shih Cheng ; Li, Katherine Shu Min

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Nat. Chung-Hsing Univ., Taichung
  • fYear
    2008
  • fDate
    18-21 May 2008
  • Firstpage
    2641
  • Lastpage
    2644
  • Abstract
    Code-based test data compression schemes encode symbols in the test data with predetermined codewords so that data volume can be reduced. The compression efficiency is affected by the distribution of data symbols. In this paper, we first analyze the factors that affect the encoding efficiency in various codes, and then propose a skewed-distribution scan chain partitioning scheme, in which the distribution of 0´s and 1´s are changed in different parts of the scan chain. Both analytical and experimental results confirm that the scheme can effectively improve compression efficiency, while the routing penalty due to the partitioning method is limited.
  • Keywords
    boundary scan testing; data compression; logic testing; code based test data compression schemes; compression efficiency; data symbols distribution; predetermined codewords; skewed distribution scan chain partition; Automatic testing; Circuit testing; Computer science; Data engineering; Decoding; Dictionaries; Frequency; Registers; Routing; Test data compression;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    978-1-4244-1683-7
  • Electronic_ISBN
    978-1-4244-1684-4
  • Type

    conf

  • DOI
    10.1109/ISCAS.2008.4541999
  • Filename
    4541999