Automatic Testing of a 28 GHz LMDS Downconverter

Automatic testing has been implemented during volume production of a low-cost downconverter for use in the 28 GHz band. Existing Automatic Test Equipment (ATE) has been leveraged and modified for microwave and millimeter operation. This paper presents a generic block diagram of the downconverter, discusses the types of measurements made, the test methodology and the equipment used to make the measurements. The fixture and associated ATE hardware are also discussed. Calibration methods and techniques to minimize measurement uncertainties are presented. Data analysis methods (i.e. SPC) and typical results are outlined. A brief discussion on the M/A-COM custom ATE platform and fundamental SPW architecture is included.