DocumentCode :
1845173
Title :
Scaling of serially-connected MOSFET chains
Author :
Vemuru, Srinivasa R
Author_Institution :
Dept. of Electr. Eng., City Coll. of New York, NY, USA
fYear :
1994
fDate :
4-5 Mar 1994
Firstpage :
200
Lastpage :
203
Abstract :
Scaling of serially-connected MOSFETs results in reduced propagation delays and power dissipation. Delay formulae and optimum scaling factors are derived as functions of capacitive load, diffusion capacitance and number of MOSFETs in the serially-connected chain using exponential-scaling and linear-scaling methods
Keywords :
CMOS integrated circuits; integrated logic circuits; logic gates; CMOS logic gates; capacitive load; delay formulae; diffusion capacitance; exponential-scaling methods; linear-scaling methods; optimum scaling factors; power dissipation; propagation delays; serially-connected MOSFET chains; CMOS logic circuits; Capacitance; Decision support systems; Delay estimation; Logic gates; MOSFET circuits; Power MOSFET; Power supplies; Propagation delay; Semiconductor device modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI, 1994. Design Automation of High Performance VLSI Systems. GLSV '94, Proceedings., Fourth Great Lakes Symposium on
Conference_Location :
Notre Dame, IN
Print_ISBN :
0-8186-5610-7
Type :
conf
DOI :
10.1109/GLSV.1994.289969
Filename :
289969
Link To Document :
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