The Thermal-Step-Technique applied to the study of charge decay in a film of polypropylene

Author

Enrici, P. ; Popiel, L. ; Reboul, J.P. ; Toureille, A.

Author_Institution

Lab. d´´Electron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France

fYear

1994

fDate

23-26 Oct 1994

Firstpage

189

Lastpage

194

Abstract

The measurement of space charge location in insulating materials is necessary to know the residual electric field inside thick samples. So we have studied conduction phenomena and electric behaviour of these materials. The Thermal Step (T.S.) technique has been already used to measure the remaining electric field and space charge in polymers slabs in the thickness range 0.5 mm to 20 mm. In this work, we have extended this method to thin films. We have increased the speed of step and the acquisition. We present the results on 12 μm polypropylene films. The applications concern power capacitors and interface contact problems (AL/PP)

Keywords

dielectric measurement; AL/PP interface contact; charge decay; conduction; insulating materials; polymers; polypropylene; power capacitors; residual electric field; space charge measurement; thermal step technique; thin films; Charge measurement; Conducting materials; Current measurement; Dielectrics and electrical insulation; Electric variables measurement; Polymer films; Power capacitors; Slabs; Space charge; Thickness measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulation and Dielectric Phenomena, 1994., IEEE 1994 Annual Report., Conference on

Conference_Location

Arlington, TX

Print_ISBN

0-7803-1950-8

Type

conf

DOI

10.1109/CEIDP.1994.591740

Filename

591740