Title :
Electrically induced mechanical strain in insulating dielectrics
Author :
Lewis, T.J. ; Llewellyn, J.P. ; van der Sluijs, M.J.
Author_Institution :
Inst. of Molecular & Biomolecular Electron., Univ. of Wales, Bangor, UK
Abstract :
We review the theory of electrically-induced mechanical forces in a dielectric and deduce that an important mechanical stress can be expected which acts in planes normal to the electrical field lines. This stress could be particularly large at interfaces and give rise to electrocapillarity. It is shown that it can also exist in the bulk of a dielectric, giving rise to a generalised piezoelectricity
Keywords :
dielectric materials; electrical forces; electrically induced mechanical strain; electrocapillarity; generalised piezoelectricity; insulating dielectrics; interface stress; mechanical stress; Capacitive sensors; Dielectric materials; Dielectrics and electrical insulation; Electric breakdown; Molecular electronics; Morphology; Piezoelectric polarization; Solids; Table lookup; Thermal stresses;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1994., IEEE 1994 Annual Report., Conference on
Conference_Location :
Arlington, TX
Print_ISBN :
0-7803-1950-8
DOI :
10.1109/CEIDP.1994.591765
