• DocumentCode
    1847643
  • Title

    Deriving Error Bounds on Measured Noise Factors Using Active Device Verification

  • Author

    Van den Bosch, Sven ; Martens, Luc

  • Author_Institution
    Department of Information technology, University of Gent, Sint-Pietersnieuwstraat 41, B-9000 Gent, Belgium.; Flemish Institute for the Promotion of the Scientific and Technological Research in Industry (IWT)
  • Volume
    36
  • fYear
    2000
  • fDate
    Dec. 2000
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    We have implemented an active device verification procedure for noise factor measurements into existing commercially available noise measurement software. The method was used for verifying GaAs MESFET noise factor measurements. Also, an approximation was developed, providing an error on the measured 50¿ noise factors.
  • Keywords
    Acoustic reflection; Active noise reduction; Calibration; Gallium arsenide; MESFETs; Measurement standards; Noise figure; Noise measurement; Power measurement; Transmission line measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Spring, 54th
  • Conference_Location
    Atlanta, GA, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1999.327371
  • Filename
    4120073
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1847643