DocumentCode :
1848161
Title :
Bit-Error-Rate Estimation for OFDM Based Telecommunication Systems Schemes in the Presence of Nonlinear Distortions
Author :
Vandersteen, Gerd ; Rolain, Yves ; van Moer, Wendy ; Verbeeck, Jef ; Schoukens, Johan
Author_Institution :
Vrije Universiteit Brussel / Dept. ELEC, Pleinlaan 2, B-1050 Brussels - Belgium, IMEC / MIRA, Kapeldreef 75, B-3001 Heverlee - Belgium
Volume :
37
fYear :
2000
fDate :
15-16 June 2000
Firstpage :
1
Lastpage :
7
Abstract :
The large number of carriers and the huge number of possible transmitted symbols in an Orthogonal Frequency Domain Multiplexing (OFDM) modulation makes it a challenge to estimate the Bit-Error-Rate (BER) in the presence of nonlinear distortion. This paper proposes a quasi analytical method for estimating the BER of such OFDM modulation schemes using a relative small number of measurements on the nonlinear circuit. The presented theory is compared with Monte Carlo simulations and is demonstrated on RF measurements. The latter are performed on an RF amplifier using a vectorial nonlinear network analyser.
Keywords :
Bit error rate; Distortion measurement; Frequency domain analysis; Frequency estimation; Nonlinear circuits; Nonlinear distortion; OFDM modulation; Performance analysis; Radio frequency; Radiofrequency amplifiers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference Digest-Spring, 55th
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-5686-1
Type :
conf
DOI :
10.1109/ARFTG.2000.327405
Filename :
4120097
Link To Document :
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