DocumentCode :
1850277
Title :
A Method of Developing Frequency-Domain Models for Nonlinear Circuits Based on Large-Signal Measurements
Author :
Jargon, Jeffrey ; Gupta, K.C. ; Schreurs, Dominique ; Remley, Kate ; DeGroot, Donald
Author_Institution :
National Institute of Standards and Technology, 325 Broadway, M/S 813.01, Boulder, CO 80305, USA, Tel: 303.497.3596 | Fax: 303.497.3970 | E-mail: jargon@boulder.nist.gov
Volume :
40
fYear :
2001
fDate :
Nov. 2001
Firstpage :
1
Lastpage :
14
Abstract :
We describe a method of generating models for nonlinear devices and circuits, based upon measurements of travelling-wave voltages at a periodic large-signal excitation and its harmonics using a nonlinear vector network analyzer. Utilizing a second source, we use multiple measurements of a nonlinear circuit to train artificial neural network models that yield portable, nonlinear large-signal scattering parameters. We obtain an independent check by comparing an example diode-circuit model generated by means of this methodology with a harmonic-balance simulation.
Keywords :
Artificial neural networks; Circuit simulation; Diodes; Frequency measurement; Harmonic analysis; Instruments; Nonlinear circuits; Scattering parameters; Vectors; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference Digest-Fall, 58th
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-5686-1
Type :
conf
DOI :
10.1109/ARFTG.2001.327484
Filename :
4120187
Link To Document :
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