DocumentCode :
1850326
Title :
Preliminary results obtained from novel CdZnTe pad detectors
Author :
Turner, T.O. ; Joyce, David ; Yin, Shi ; Pi, Bo ; Zhao, Shulai ; Willson, Paul ; Parnham, Kevin ; Glick, Bruce
Author_Institution :
NOVA Res. & Dev. Inc., Riverside, CA, USA
Volume :
1
fYear :
1995
fDate :
21-28 Oct 1995
Firstpage :
109
Abstract :
CdZnTe pad detectors with a novel geometry and approximately 1 mm 2 pad sizes is being developed. These detectors have been specially designed for high energy resolution up to 300 keV energies. The contacts are produced through a unique technique developed by eV Products to achieve high reliability low resistance coupling to the substrate. A ceramic carrier is developed for low capacitance coupling of the detectors to NOVA´s FEENA chip. The detectors have been tested using the ultra low noise single and 3-channel amplifiers developed by eV Products. The CdZnTe detectors are tested for dark current. The charge energy resolutions and collection times are also measured using natural radiation sources. The measured detector parameters and the test results are showing that linear pad arrays can have good uniformity and excellent application potential for imaging X-rays and gamma-rays. The results obtained for the energy resolution is excellent for spectroscopy applications in nuclear physics and the short charge collection time can be used for fast imaging
Keywords :
X-ray detection; dark conductivity; gamma-ray apparatus; gamma-ray detection; semiconductor counters; 1 mm; 300 keV; CdZnTe; CdZnTe pad detectors; FEENA chip; X-rays; charge collection times; charge energy resolutions; contacts; dark current; energy resolution; gamma-rays; linear pad arrays; low noise single amplifiers; low noise three-channel amplifiers; Capacitance; Ceramics; Contact resistance; Detectors; Energy resolution; Geometry; Low-noise amplifiers; Optical imaging; Semiconductor device measurement; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference Record, 1995., 1995 IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-3180-X
Type :
conf
DOI :
10.1109/NSSMIC.1995.504188
Filename :
504188
Link To Document :
بازگشت