Title :
Broadband microwave testing: a new approach to scalar analysis
Author :
Case, Stalley P. ; Craig, Kenneth C.
Abstract :
Microwave measurement technology advances promote improved broadband testing. Typical microwave measurement techniques require: a scalar analyzer for insertion loss, gain, and return loss measurements; a power meter for accurate CW power measurements; and a peak power meter for pulsed RF measurements. Older scalar analyzers are not very useful in testing pulsed modes. The Wavetek 8003 Precision Scalar Analyzer and Hewlett-Packard 83623A Synthesized Sweeper used in the TWT Automated Test Station (TATS) at the Electronic Warfare Directorate of Warner Robins Air Logistics Center (WR-ALC/LN) provide CW power, pulsed RF power, insertion loss, gain, and return loss measurements in fixed frequency and swept modes. An absolute power mode provides accurate power measurements at the sensor input. A measurement minus pathcal mode (used for insertion loss and gain) returns relative power based on a stored path calibration reference. These new capabilities can be further improved by extending typical scalar analyzer calibration concepts. The precision scalar analysis topics and examples based on TATS development are discussed. Other techniques discussed include gain variation versus frequency analysis and swept saturated power tests
Keywords :
aircraft instrumentation; automatic test equipment; automatic testing; calibration; electron tube testing; gain measurement; loss measurement; military systems; network analysers; power measurement; swept-frequency reflectometry; ATE; CW power; EW; TWT testing; broadband microwave testing; calibration; frequency response; gain measurement; insertion loss measurement; microwave measurement technology; power-gain measurement; precision scalar analysis; pulsed RF power measurement; return loss measurements; synthesized sweeper flatness; Calibration; Gain measurement; Insertion loss; Loss measurement; Microwave measurements; Microwave technology; Power measurement; Pulse measurements; Radio frequency; Testing;
Conference_Titel :
Aerospace and Electronics Conference, 1993. NAECON 1993., Proceedings of the IEEE 1993 National
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-1295-3
DOI :
10.1109/NAECON.1993.290810