Title :
Intelligent scheduling optimization using a rule-based artificial neural network
Author :
Ruegsegger, Steven M.
Author_Institution :
Case Western Reserve Univ., Cleveland, OH, USA
Abstract :
Requirements for greater precision and reduced rejection/acceptance errors demand improved inspection methods that can be provided by implementing increased automation into the quality control (QC) process. Automated inspection planners can require significant human interface work deciphering the generated output, often requiring more work than the service they provide. The output of an automated inspection planner needs to produce a process plan that would resemble one created by an expert inspector. This paper discusses the implementation of an artificial neural network (ANN) to optimize the sequence of inspection points based upon inspection rule criteria. Using features from a feature-based CAD, the automated inspection planner uses the inspection rules to create “rule matrices” that the ANN will use to sequence the inspection points to be probed by a coordinate measurement machine (CMM). This is an extension of the familiar traveling salesman problem (TSP) solved by a Hopfield neural network
Keywords :
CAD; combinatorial mathematics; computer aided production planning; inspection; knowledge based systems; matrix algebra; neural nets; optimisation; quality control; scheduling; spatial variables measurement; Hopfield neural network; artificial neural network; automated inspection; concurrent engineering; coordinate measurement machine; expert inspector; feature-based CAD; human interface; inspection points; intelligent scheduling optimization; process plan; quality control; rejection/acceptance errors; rule matrices; rule-based artificial neural network; traveling salesman problem; Artificial intelligence; Artificial neural networks; Automation; Coordinate measuring machines; Error correction; Hopfield neural networks; Humans; Inspection; Quality control; Traveling salesman problems;
Conference_Titel :
Aerospace and Electronics Conference, 1993. NAECON 1993., Proceedings of the IEEE 1993 National
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-1295-3
DOI :
10.1109/NAECON.1993.290840