DocumentCode :
1851657
Title :
Active IR thermography processing based on Higher Order Statistics for nondestructive evaluation
Author :
Vrabie, Valeriu ; Perrin, Eric ; Bodnar, Jean-Luc ; Mouhoubi, Kamel ; Detalle, Vincent
Author_Institution :
CReSTIC, Univ. of Reims Champagne-Ardenne, Reims, France
fYear :
2012
fDate :
27-31 Aug. 2012
Firstpage :
894
Lastpage :
898
Abstract :
Active infrared thermography is a nondestructive method for evaluating defects in artworks. A conventional excitation radiation heats the sample and the photothermal response is recorded by an infrared (IR) camera. Classical pulsed excitation has shown the feasibility of such a detection system, but the energy deposition for a long period of time can alter samples. Random excitations can prevent such problem, but signal processing methods should be implemented to extract the useful information. We propose a processing method that combines Singular Value Decomposition (SVD) and Higher Order Statistics (HOS). The former decomposes the dataset in several subspaces, allowing to remove the influence of the acquisition environment and system. The latter is used to build up from the useful information one or two images for diagnostic. We show on a mural-type "laboratory" and on a in situ artwork that this method allows good identification of defects, providing a complementary detector to classical analysis.
Keywords :
higher order statistics; image processing; infrared imaging; nondestructive testing; photothermal effects; singular value decomposition; HOS; IR camera; SVD; acquisition environment; acquisition system; active IR thermography processing; artwork defect evaluation; detection system; energy deposition; excitation radiation heats; higher order statistics; in situ artwork; infrared camera; mural-type laboratory; nondestructive evaluation; photothermal response; pulsed excitation; random excitations; signal processing methods; singular value decomposition; Cameras; Estimation; Higher order statistics; Market research; Noise; Vectors; Active infrared thermography; Higher Order Statistics; Kurtosis; Singular Value Decomposition; Skewness; Subspace decomposition;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal Processing Conference (EUSIPCO), 2012 Proceedings of the 20th European
Conference_Location :
Bucharest
ISSN :
2219-5491
Print_ISBN :
978-1-4673-1068-0
Type :
conf
Filename :
6334047
Link To Document :
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