DocumentCode :
1851943
Title :
A pixel readout chip with an internal tunable delay and binary output for an LHC vertex detector
Volume :
1
fYear :
1995
fDate :
21-28 Oct 1995
Abstract :
The Omega3/LHC1 pixel detector readout chip is aimed at future LHC vertex detector applications. It is the latest member of the Omega series designed at CERN. It comprises an array of 128×16 pixel readout cells of 50 μm×500 μm and the chip contains more than 800,000 transistors. In the design particular emphasis is given to cell-to-cell and chip-to-chip uniformity, and testability, proven key parameters in existing pixel systems. Each cell contains a full readout chain with preamp, discriminator with adjustable threshold and fast-OR output, a globally adjustable delay with local fine-tuning, coincidence logic and memory. Each cell can be individually addressed for electrical test and masking. Several operation modes allow full testing and data acquisition with different ways to resolve timing ambiguities. The layout of one cell and the corresponding chip photograph are shown below. We present results obtained from electrical tests of a chip without detector as well as from radioactive source measurements using a chip which has been bump-bonded to a 300 μm thick Si detector. A timewalk of <10 ns and a delay precision of <6 ns rms have been measured. The noise is ~100 e- rms. The lowest threshold setting is close to 3000 e- and the non-uniformity has been measured to be ~450 e- rms at a threshold of 5 000 e- . Source measurements showed good uniformity of response to both β and γ rays
Keywords :
data acquisition; detector circuits; discriminators; monolithic integrated circuits; nuclear electronics; position sensitive particle detectors; preamplifiers; β detection; γ ray detection; 10 ns; 300 mum; 50 mum; 6 ns; LHC; Omega3/LHC1 pixel detector readout chip; Si; Si detector; binary output; cell-to-cell uniformity; chip-to-chip uniformity; coincidence logic; data acquisition; delay precision; discriminator; electrical tests; fast-OR output; internal tunable delay; memory; noise; pixel readout chip; preamp; radioactive source measurements; timewalk; vertex detector; Data acquisition; Delay; Detectors; Electric variables measurement; Large Hadron Collider; Logic; Semiconductor device measurement; System testing; Thickness measurement; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference Record, 1995., 1995 IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-3180-X
Type :
conf
DOI :
10.1109/NSSMIC.1995.504257
Filename :
504257
Link To Document :
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