DocumentCode :
1852856
Title :
Match hypothesis evaluation for synthetic aperture radar targets
Author :
Fister, Tom ; Garber, Fred ; Sawtelle, Steve ; Withman, Ray
Author_Institution :
Dept. of Electr. Eng., Wright State Univ., Dayton, OH, USA
fYear :
1993
fDate :
24-28 May 1993
Firstpage :
269
Abstract :
The work described in this paper focuses on recent progress in radar signal processing and target recognition techniques developed in support of WL/AARA target recognition programs. The goal of the program is to develop evaluation methodologies of hypotheses in a model-based framework. Processing begins with a structural analysis using parametric modeling of radar scattering centers. The energy, location, dispersion and shape of all measured target scattering centers are parameterized. The resulting structural description is used to represent each target and is used to evaluate the hypotheses of the targets in the candidate set as indicated by an initial index inputs. The hypothesis evaluation process keys on the largest, most similar scatterers, with registration and proximity constraints. A probability estimate is computed for each hypothesis based on relative cross-section differences, target scattering center non-correspondences and model scattering center non-correspondences. The entire modeling and computation process is accomplished within Mathematica
Keywords :
array signal processing; pattern recognition; probability; radar theory; synthetic aperture radar; Mathematica; likelihood function; match hypothesis evaluation; match sorting; model scattering center noncorrespondences; modeling; parametric modeling; probability; radar array; radar scattering centers; radar signal processing; relative cross-section differences; structural analysis; structural description; synthetic aperture radar targets; target recognition; target scattering center noncorrespondences; Computational modeling; Dispersion; Energy measurement; Mathematical model; Parametric statistics; Radar scattering; Radar signal processing; Scattering parameters; Shape measurement; Target recognition;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Aerospace and Electronics Conference, 1993. NAECON 1993., Proceedings of the IEEE 1993 National
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-1295-3
Type :
conf
DOI :
10.1109/NAECON.1993.290927
Filename :
290927
Link To Document :
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