Title :
Reliability analysis of fault-tolerance voyage data recorder system
Author :
Hao, Yanling ; Zhou, Wenjun
Author_Institution :
Coll. of Autom., Harbin Eng. Univ., China
fDate :
29 July-1 Aug. 2005
Abstract :
The paper expounded the reliability of voyage data recorder (VDR) system, modeled and analyzed the system by classical analytical method Markov model focused on VDR that can be spot maintained. Then concluded that the reliability of double fault-tolerance system will be enhance by more 2000 times than single-processing system. This conclusion fits for the worked fact of VDR.
Keywords :
Markov processes; data recording; fault tolerance; reliability theory; Markov model; double fault-tolerance system; modeling analysis technology; reliability analysis; single-processing system; voyage data recorder system; Accidents; Analytical models; Assembly; Automation; Boats; Data engineering; Educational institutions; Fault tolerant systems; Maintenance engineering; Reliability engineering;
Conference_Titel :
Mechatronics and Automation, 2005 IEEE International Conference
Print_ISBN :
0-7803-9044-X
DOI :
10.1109/ICMA.2005.1626904
