DocumentCode :
1853691
Title :
Phase drift effects in sampling microwave measurement systems
Author :
Loglio, Giovanni ; Jargon, Jeffrey ; DeGroot, Donald C. ; Popovic, Zoya
Author_Institution :
Universita degli Studi di Firenze, Italy
fYear :
2005
fDate :
38520
Firstpage :
165
Lastpage :
168
Keywords :
measurement uncertainty; microwave measurement; phase noise; signal sampling; downconverted signal; downconvertor-based measurement systems; local oscillator; measurement uncertainty; microwave measurement systems; nonlinear fitting; phase drift effects; phase noise; phase-modulated signal; time-varying quantity; wave variables; Frequency conversion; Microwave measurements; Noise measurement; Phase measurement; Phase noise; Pulse generation; Pulse measurements; Sampling methods; Signal analysis; Signal processing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference Digest, 2005. Spring 2005. 65th
Print_ISBN :
0-7803-8858-5
Type :
conf
DOI :
10.1109/ARFTGS.2005.1500587
Filename :
1500587
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1853691
بازگشت