• DocumentCode
    1854085
  • Title

    Analysis of interaction between microwave antennas and frequency selective surface (FSS) radomes

  • Author

    Prakash, V.V.S. ; Mittra, R.

  • Author_Institution
    Pennsylvania State Univ., University Park, PA, USA
  • Volume
    4
  • fYear
    2003
  • fDate
    22-27 June 2003
  • Firstpage
    404
  • Abstract
    The interaction between the microwave antenna and the FSS is analyzed by using a modified plane wave spectrum approach. The analysis of the antenna is carried out by using CFDTD technique in order to obtain its aperture fields which are in turn used as an excitation for the FSS. Both the aperture electric and magnetic fields of the antenna are used in deriving the spectrum. The original truncated FSS problem has been transformed into an equivalent one that renders it far more manageable to treat than its original version. This is especially true for large radomes, comprising hundreds, if not thousands of elements. The proposed method is validated by comparison with measurement. The method is completely general and can handle various types of microwave antennas, FSS elements of different shapes, and FSS radomes with arbitrary boundary truncations.
  • Keywords
    antenna radiation patterns; antenna theory; aperture antennas; finite difference time-domain analysis; frequency selective surfaces; radomes; waveguide antennas; 3-D conformal FDTD technique; aperture fields; arbitrary boundary truncations; composite antenna-radome structure; frequency selective surface radomes; large radomes; microwave antenna interaction; modified plane wave spectrum approach; proximity effects; radiating antenna; radiation pattern; truncated FSS problem; Aperture antennas; Electronic mail; Frequency selective surfaces; Magnetic analysis; Magnetic fields; Microwave antennas; Performance gain; Radar antennas; Scattering; Spatial filters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2003. IEEE
  • Conference_Location
    Columbus, OH, USA
  • Print_ISBN
    0-7803-7846-6
  • Type

    conf

  • DOI
    10.1109/APS.2003.1220206
  • Filename
    1220206