DocumentCode :
1854399
Title :
Investigation of failure patterns of desktop computer power supplies using a lightning surge simulator and the generation of a database for a comprehensive surge propagation study
Author :
James, Sisira ; Kularatna, Nihal ; Steyn-Ross, Alistair ; Pandey, Amit ; Künnemeyer, Rainer ; Tantrigoda, Dhammika
Author_Institution :
Univ. of Waikato, Hamilton, New Zealand
fYear :
2010
fDate :
7-10 Nov. 2010
Firstpage :
1275
Lastpage :
1280
Abstract :
According to the International Technology Roadmap for Semiconductors (ITRS) future VLSI devices of gigahertz capability are expected to have feature sizes below 45 nm with DC power supply requirements with sub 1V and the equivalent noise voltages close to the DC rail values. This scenario makes the surge resist capability of processor type loads and the associated power conversion interfaces with lot of power semiconductors, seriously vulnerable to lightning and other power transients. In a major research project to predict the propagation of transients within the power conversion interfaces using wavelet transform, it was necessary to develop an experimental database of surge failures in power electronic subsystems. This paper highlights the results of destructive testing of desk top PC power supplies using a lightning surge simulator which will be used for comparing experimental data with analytical/simulated results.
Keywords :
lightning protection; power conversion; power supplies to apparatus; power system transients; surge protection; DC power supply; ITRS; International Technology Roadmap for Semiconductors; VLSI devices; database generation; desktop computer power supplies; failure patterns investigation; lightning surge simulator; power conversion; power electronic subsystems; power semiconductors; power transients; surge propagation study; transients propagation; wavelet transform; Power supplies; Rails; Surge protection; Surges; Switches; Transient analysis; Uninterruptible power systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
IECON 2010 - 36th Annual Conference on IEEE Industrial Electronics Society
Conference_Location :
Glendale, AZ
ISSN :
1553-572X
Print_ISBN :
978-1-4244-5225-5
Electronic_ISBN :
1553-572X
Type :
conf
DOI :
10.1109/IECON.2010.5675553
Filename :
5675553
Link To Document :
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