Title :
Initlability: a measure of sequential testability
Author :
Hamida, N.B. ; Kaminska, Bozena ; Savaria, Yvon
Author_Institution :
Ecole Polytechnique de Montreal
Keywords :
Circuit faults; Circuit testing; Combinational circuits; Controllability; Flip-flops; Logic testing; Observability; Sequential analysis; Sequential circuits; System testing;
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Conference_Location :
IEEE
Print_ISBN :
0-7803-1281-3