• DocumentCode
    1855243
  • Title

    An iDD transient analysis technique for defect detection in digital integrated circuits

  • Author

    Beasley, Jeff ; Ramirez-Angulo, Jaime ; Steiner, Robert

  • Author_Institution
    Dept. of Eng. Technol., New Mexico State Univ., Las Cruces, NM, USA
  • Volume
    1
  • fYear
    1995
  • fDate
    13-16 Aug 1995
  • Firstpage
    286
  • Abstract
    This paper presents a unique method for detecting defects in digital integrated circuits by analyzing the changes observed in the transient power supply currents for the device under test. The transient currents are generated by simultaneously pulsing the VDD and VSS power supply rails using a technique called iDD Pulse Response Testing
  • Keywords
    digital integrated circuits; fault diagnosis; integrated circuit testing; transient analysis; defect detection; digital integrated circuits; power supply current; pulse response testing; transient analysis; Circuit analysis; Circuit testing; Current supplies; Digital integrated circuits; Integrated circuit testing; Power generation; Power supplies; Pulse generation; Pulsed power supplies; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1995., Proceedings., Proceedings of the 38th Midwest Symposium on
  • Conference_Location
    Rio de Janeiro
  • Print_ISBN
    0-7803-2972-4
  • Type

    conf

  • DOI
    10.1109/MWSCAS.1995.504433
  • Filename
    504433
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1855243