DocumentCode :
1855527
Title :
A Robust Minimum Variance Beamforming Approach for the Removal of the Eye-Blink Artifacts from EEGs
Author :
Nazarpour, K. ; Wongsawat, Y. ; Sanei, S. ; Oraintara, S. ; Chambers, J.A.
Author_Institution :
Cardiff Univ., Cardiff
fYear :
2007
fDate :
22-26 Aug. 2007
Firstpage :
6211
Lastpage :
6214
Abstract :
In this paper a novel scheme for the removal of eye-blink (EB) artifacts from electroencephalogram (EEG) signals based on the robust minimum variance beamformer (RMVB) is proposed. In this method, in order to remove the artifact, the RMVB is provided with a priori information, i.e., an estimation of the steering vector corresponding to the point source EB artifact. The artifact-removed EEGs are subsequently reconstructed by deflation. The a priori knowledge, namely the vector corresponding to the spatial distribution of the EB factor, is identified using a novel space-time-frequency-time/segment (STF-TS) model of EEGs, provided by a four-way parallel factor analysis (PARAFAC) approach. The results demonstrate that the proposed algorithm effectively identifies and removes the EB artifact from raw EEG measurements.
Keywords :
electroencephalography; medical signal processing; signal reconstruction; time-frequency analysis; EEG; RMVB; electroencephalogram; eye-blink artifact removal; four-way parallel factor analysis; robust minimum variance beamformer; space-time-frequency-time segment model; steering vector estimation; Array signal processing; Brain modeling; Computational complexity; Electrodes; Electroencephalography; Electrooculography; Independent component analysis; Principal component analysis; Robustness; Scalp; Algorithms; Artifacts; Artificial Intelligence; Blinking; Brain; Diagnosis, Computer-Assisted; Electroencephalography; Electrooculography; Humans; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2007. EMBS 2007. 29th Annual International Conference of the IEEE
Conference_Location :
Lyon
ISSN :
1557-170X
Print_ISBN :
978-1-4244-0787-3
Type :
conf
DOI :
10.1109/IEMBS.2007.4353774
Filename :
4353774
Link To Document :
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