DocumentCode
185641
Title
Defect Prediction between Software Versions with Active Learning and Dimensionality Reduction
Author
Huihua Lu ; Kocaguneli, Ekrem ; Cukic, Bojan
Author_Institution
Lane Dept. of Comput. Sci. & Electr. Eng., West Virginia Univ., Morgantown, WV, USA
fYear
2014
fDate
3-6 Nov. 2014
Firstpage
312
Lastpage
322
Abstract
Accurate detection of defects prior to product release helps software engineers focus verification activities on defect prone modules, thus improving the effectiveness of software development. A common scenario is to use the defects from prior releases to build the prediction model for the upcoming release, typically through a supervised learning method. As software development is a dynamic process, fault characteristics in subsequent releases may vary. Therefore, supplementing the defect information from prior releases with limited information about the defects from the current release detected early seems to offer intuitive and practical benefits. We propose active learning as a way to automate the development of models which improve the performance of defect prediction between successive releases. Our results show that the integration of active learning with uncertainty sampling consistently outperforms the corresponding supervised learning approach. We further improve the prediction performance with feature compression techniques, where feature selection or dimensionality reduction is applied to defect data prior to active learning. We observe that dimensionality reduction techniques, particularly multidimensional scaling with random forest similarity, work better than feature selection due to their ability to identify and combine essential information in data set features. We present the improvements offered by this methodology through the prediction of defective modules in the three successive versions of Eclipse.
Keywords
configuration management; feature selection; learning (artificial intelligence); program verification; software fault tolerance; uncertainty handling; Eclipse; active learning; data set features; defect information; defect prediction; defect prone modules; defective modules; defects detection; dimensionality reduction; fault characteristics; feature compression techniques; feature selection; multidimensional scaling; prediction model; random forest similarity; software development; software versions; supervised learning method; uncertainty sampling; verification activities; Computational modeling; Measurement; Predictive models; Radio frequency; Software; Supervised learning; Uncertainty; Active learning; Complexity measures; Dimensionality reduction; Machine learning; Software defect prediction;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Reliability Engineering (ISSRE), 2014 IEEE 25th International Symposium on
Conference_Location
Naples
ISSN
1071-9458
Print_ISBN
978-1-4799-6032-3
Type
conf
DOI
10.1109/ISSRE.2014.35
Filename
6982637
Link To Document