• DocumentCode
    1856740
  • Title

    Cu(In, Al)S2 thin films prepared from rapid thermal annealing of Cu-In-Al-S precursors and Cu-In-Al alloys

  • Author

    Oda, Yusuke ; Hamazaki, Ryosuke ; Fukamizu, Shohei ; Yamamoto, Akito ; Minemoto, Takashi ; Takakura, Hideyuki

  • Author_Institution
    Ritsumeikan Global Innovation Res. Organ., Ritsumeikan Univ., Kusatsu, Japan
  • fYear
    2011
  • fDate
    19-24 June 2011
  • Abstract
    Cu(In,Al)S2 (CIAS) absorbers had heavy roughness and a lot of particles like islands, in addition, the grain-size was small in the co-evaporation at high substrate temperature of 500°C~, resulted in the low efficiency. To enhance the flatness and the crystal growth (large grain-size), we investigated CIAS absorbers prepared from post-annealed Cu-In-Al-S precursors and sulfurized Cu-In-Al alloys. A rapid thermal processing was used in the post-annealing and the sulfurization. The flatness of the post-annealed Cu-In-Al-S precursors enhanced but the efficiency of solar cells used the precursors was low due to the incomplete crystal growth. In contract, the sulfurized Cu-In-Al alloys became the separated layers which were the large grain-size layer and the small grain-size layer. It was revealed that the large grain-size layer and small one were CuInS2 and CIAS from both an XRD and an EDS analysis of the detached film. Furthermore, 9.6% efficiency was obtained in the solar cell used the sulfurized Cu-In-Al alloy.
  • Keywords
    X-ray diffraction; aluminium alloys; copper alloys; crystal growth; evaporation; grain size; indium alloys; rapid thermal annealing; solar cells; thin films; CIAS absorbers; Cu(InAl)S2; Cu-In-Al alloys; Cu-In-Al-S precursors; EDS analysis; XRD; co-evaporation; crystal growth; grain size layer; rapid thermal annealing; solar cells; sulfurization; thin films; Annealing; Crystals; Films; Metals; Photovoltaic cells; Substrates; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-9966-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2011.6185985
  • Filename
    6185985