• DocumentCode
    1856774
  • Title

    Examining the effects of geometric uncertainty when computing endocardial and intracavitary probe potentials using a surface integral equation solution

  • Author

    Mayfield, D.F. ; Claydon, F.J.

  • Author_Institution
    Dept. of Biomed. Eng., Memphis Univ., TN, USA
  • fYear
    1994
  • fDate
    3-6 Nov 1994
  • Firstpage
    25
  • Abstract
    The objectives of this study were to examine the effects of geometric uncertainty when computing intracavitary probe potentials and endocardial potentials via a forward and inverse solution, respectively. A cylindrical probe with 57 unipolar electrodes and 56 subendocardial electrodes were used to simultaneously record potentials within the left ventricular (LV) cavity and LV endocardium, respectively. Geometric uncertainty was examined by: (1) rotating the intracavitary probe surface from its known position within the LV cavity about its long (z) axis by -20° and +20°; and (2) randomly perturbing the known LV endocardial geometry by ±5 mm. Quantitative comparison of results showed that the levels of geometric uncertainty used in this study did not have significant effects on the accuracy of the volume conductor model. Given the imaging modalities currently available, these levels of geometric uncertainty should be attainable when conducting studies of this nature
  • Keywords
    electrocardiography; integral equations; endocardial potentials; forward solution; geometric uncertainty effects; intracavitary probe potentials; inverse solution; left ventricular cavity; left ventricular endocardium; surface integral equation solution; volume conductor model; Biomedical computing; Biomedical electrodes; Conductors; Covariance matrix; Electrodes; Geometry; Heart; Integral equations; Probes; Solid modeling; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 1994. Engineering Advances: New Opportunities for Biomedical Engineers. Proceedings of the 16th Annual International Conference of the IEEE
  • Conference_Location
    Baltimore, MD
  • Print_ISBN
    0-7803-2050-6
  • Type

    conf

  • DOI
    10.1109/IEMBS.1994.412172
  • Filename
    412172