Title :
Diagnosis of Voltage Dependent Scan Chain Failure Using VBUMP Scan Debug Method
Author :
Khusyari, Khairul ; Ng, Wei Tee ; Jaarsma, Neal ; Abraham, Robert ; Ng, Peng Weng ; Ang, Boon Hui ; Ong, Chin Hu
Abstract :
In this paper, the scan chain diagnosis using the VBUMP Scan Debug method is presented. This diagnosis approach controls the DUT VDD during the scan shifting operation by using ATE VBUMP utility to assist in silicon debug.
Keywords :
automatic test equipment; failure analysis; integrated circuit testing; logic testing; ATE VBUMP utility; VBUMP scan debug method; logic failure; scan chain diagnosis; scan shifting operation; silicon debug; Application specific integrated circuits; Failure analysis; Fault diagnosis; Hardware; Low voltage; Semiconductor device testing; Signal analysis; Silicon; Test pattern generators; Timing; VBUMP;
Conference_Titel :
Asian Test Symposium, 2008. ATS '08. 17th
Conference_Location :
Sapporo
Print_ISBN :
978-0-7695-3396-4
DOI :
10.1109/ATS.2008.66
