DocumentCode
1858271
Title
A Software-Based Test Methodology for Direct-Mapped Data Cache
Author
Lin, Yi-Cheng ; Tsai, Yi-Ying ; Lee, Kuen-Jong ; Yen, Cheng-Wei ; Chen, Chung-Ho
Author_Institution
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan
fYear
2008
fDate
24-27 Nov. 2008
Firstpage
363
Lastpage
368
Abstract
We present a software-based test methodology that utilizes an on-chip processor to perform test procedures for direct-mapped data cache. The cache system under test is divided into two major groups, namely the memory modules and the logic modules. For the memory modules which include the tag memory, the data memory, and the physical address tag memory, systematic procedures to transform a widely-used March algorithm into various executable instruction sequences are developed. For the logic modules, extensive analysis on the functions as well as the structures (architecture, RTL, and gate-level) of these modules is carried out and effective test instruction sequences based on the analysis are derived. A 100% fault coverage for six conventional RAM fault models and 99.13% test efficiency for single stuck-at fault model are obtained on a real 32-bit RISC processor. These results validate the viability and effectiveness of the proposed methodology for data-cache testing.
Keywords
cache storage; program testing; data-cache testing; direct-mapped data cache; software-based test methodology; Built-in self-test; Cache memory; Fault diagnosis; Logic testing; Performance evaluation; Random access memory; Read-write memory; Reduced instruction set computing; Software testing; System testing; cache memories; cache testing; manufacturing testing; memory testing; software based self-testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Asian Test Symposium, 2008. ATS '08. 17th
Conference_Location
Sapporo
ISSN
1081-7735
Print_ISBN
978-0-7695-3396-4
Type
conf
DOI
10.1109/ATS.2008.60
Filename
4711618
Link To Document